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Nikita Deshpande

Specialist Mapping & Defect Management Solutions @Infineon Technologies

Dresden, DE
EMAILS
d••••••••@infineon.com
MOBILE NUMBERS
+91 *********19

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WORK HISTORY

Jan 2024 — Present

Specialist Mapping & Defect Management Solutions @Infineon Technologies

Dresden, DE

Defect Data extraction, cleansing, correlation & analysis- Yield trend monitoring and reporting for Infineon fabs worldwide- Supporting & enhancing global software applications for frontend fabs defect density specialists- Working across Liinux, Perl, C#, and C++ legacy systems to maintain and modernise tool interfaces- Agile-driven execution with cross-team collaboration & continuous improvement mindset

EDUCATION

2010 — 2012

Vidyabharati Mahavidyalaya , C.K. Nayadu Road , Camp, Amravati.

HSC

2012 — 2016

Prof Ram meghe institute of technology and research Badnera, Amravati

Bachlor of engineering (B.E)

2006 — 2010

Golden Kids English School Amravati

SSC

2019 — 2023

Technische Universität Chemnitz

Masters

ABOUT NIKITA DESHPANDE

As a Specialist in Defect Management Solutions with over two years at Infineon Technologies, I focus on data analysis, yield trend monitoring, and global software application support for frontend fabs. My role involves working across Linux, Perl, C#, and C++ systems to enhance tool interfaces, maintain legacy systems, and modernize software within an agile framework while collaborating across teams to drive operational improvements. With a strong foundation in machine learning and generative AI from my previous roles at the Center for Advanced Systems Understanding and Roche, I bring expertise in diffusion models, super-resolution microscopy, and representation learning. Passionate about leveraging innovative technologies, I am committed to enabling seamless factory integration and enhancing operational efficiency across global semiconductor manufacturing processes.

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