Thomas Lam
Furloughed - Physical Scientist at Smithsonian Museum Conservation Institute (*all views expressed are my own)
- Role
- Physical Scientist at Smithsonian Museum Conservation Institute
- Location
- Washington, DC, US
- LinkedIn followers
- 500 followers
About Thomas Lam
Scientist with a demonstrated history of collaboratively working in museums…
Experience
Physical Scientist
Smithsonian Museum Conservation Institute
Jan 2016 — Present · Suitland, MD, US
Thomas is in the Technical Studies group at the Smithsonian Museum Conservation Institute (MCI). As a Physical Scientist, Thomas specializes in materials characterization on materials in cultural heritage field. Specifically, Thomas works on projects revolving around applying scanning electron microscopy energy dispersive spectroscopy (SEM-EDS), cathodoluminescence (CL), X-ray fluorescence (micro-XRF or portable XRF), or microfade testing (MFT) and color measurements.Thomas has worked to apply micro-XRF within an SEM to research projects. The techniques combined allows for an improvement in detection limit (which SEM-EDS alone is ≈ ppm) down to 10’s of ppm for many elements with ≈ 35 micron spot size and a substage/rapid stage for micro-XRF mapping in the SEM. At this position the research has currently resulted in 18 co-authored peer reviewed journal papers and 4 co-authored book/proceeding chapters on materials ranging from analyzing paint cross sections, insect stingers, obsidian mirrors, metal threads, Mesoamerican axe monies, archeological glass, glass degradation, early composite materials from billiard balls, stamps, protective coatings on Ag alloys, early European porcelains, and Egyptian blue. Additionally, Thomas has also been a co-authored on 18 Microscopy and Microanalysis proceeding papers, 7 co-authored cultural heritage conference related papers and related publications (AIC postprints, ICOM, and Smithsonian Institution Scholarly Press) and 4 book/volume chapters.
Skills
- Microscopy
- Tem
- Research and Development (R&D)
- Thin Films
- Experimentation
- Chemistry
- Refractory
- Powder X-Ray Diffraction
- Ceramic
- Fib
- Focused Ion Beam (Fib)
- Characterization
- Materials Science
- Electron Microscopy
- Nanotechnology
- R&D
- Materials
- Glass
- Nanomaterials
- Scanning Electron Microscopy
- Ceramic Processing
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