Tangudu Bharat Kumar

About Tangudu Bharat Kumar

With over 8.5 years of combined experience in research and industry, I have gained proficiency in various domains, including analog circuit design and path finding projects.• Have designed a variety of analog blocks such as Op-amps, OTAs, continuous-time filters, reference generator circuits, and sensor interfacing circuits, contributing to a deep understanding of these components.• Played a crucial role in developing an industry-first gate-oxide reliability methodology for digital circuits at Intel. This methodology aimed to enhance the turbo performance of Intel products while maintaining reliability standards.• Engaged in identifying simulation test patterns to detect marginal defects in SRAM memory arraysacross different technology nodes that shows commitment to quality assurance and reliability improvement efforts

Experience

1. Staff Engineer

   Micron Technology

   Aug 2024 — Present · Hyderabad, IN

   Have been working on assessing the impact of reliability issues such as BTI, HCI, etc. on high bandwidth memory (HBM) performance in terms of timing. It is being achieved through accelerating the ageing of product by stressing the devices with more voltages, higher temperatures.

Education

• Manipal Institute of Technology

  Master of Technology (M.Tech.), Microelectronics

• Malaviya National Institute of Technology Jaipur

  Doctor of Philosophy (PhD), Analog and Mixed Signal IC Design

• Jawaharlal Nehru Technological University, Kakinada

  Bachelor of Technology (B.Tech.), Electrical, Electronics and Communications Engineering

Skills

• Electronics
• Pspice
• Microsoft Office
• Vlsi
• C