Rugved Zarkar

Ai Research Intern @National Institute of Standards and Technology (NIST)

Gaithersburg, MD, US

Contributing to CHIPS Act efforts by developing AI-enhanced methods for measuring IC line widths and edge roughness from atomic-scale SEM images, reducing the need for costly scan points through compressed sensing and supervised inpainting.Designed Python tools to process SEM images, segment features, and estimate measurement uncertainty; trained a Denoising Diffusion Probabilistic Model that reduced uncertainty by over 50%.Performed experimental tradeoff analysis across sampling strategies (Latin Hypercube, patented masks) to optimize image quality, measurement confidence, and scanning efficiency for semiconductor metrology.