Peter H. Thiesen

Application Specialist Imaging Spectroscopic Ellipsometry @Park Systems

Göttingen, DE

EMAILS

[email protected]

MOBILE NUMBERS

+91 *********19

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WORK HISTORY

Dec 2022 — Present

Application Specialist Imaging Spectroscopic Ellipsometry @Park Systems

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EDUCATION

N/A

Helmut Schmidt Universität - Universität der Bundeswehr Hamburg

Habilitation

N/A

Christian-Albrechts-Universität zu Kiel

Doktor (Ph.D.)

N/A

University of Kiel

Dipl. Chem.

SKILLS

CharacterizationApplication of Imaging Ellipsometry and Brewster Angle MicroscopySpectroscopyMaterialwissenschaft Und WerkstofftechnikWorldwide Marketing of Scientific InstrumentsChemieColloid Chemistry of GlycoconjugatesContact Angle MeasurementScienceColloid- and Surface ChemistrySurface TensionWissenschaftAdsorption, Odour ControlSpektroskopieForschung Und EntwicklungCharakterisierungEllipsometryPhysikNanomaterialien

ABOUT PETER H. THIESEN

Spectroscopic Imaging Ellipsometer enable ellipsometry with the lateral resolution of an optical microscope and with the unique sensitivity of ellipometry for ultrathin films and changes in the optical properties.Typical applications- Graphene & other 2D materials- Organic electronics- Organic solar cells- OLED- MEMS- Polymer brushes- Thin polymer films- Self-assembled monolayers (SAM)- Lipid bilayers- Liquid / liquid interface- OthersVery close related is Brewster Angle microscopy – a technique that enable especially the visualization of nanofilms at the air/water interface.Applications of Brewster Angle Microscopy- Lipid monolayers- Langmuir-Blodgett films- Floating monolayers- Air / water interface

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