Panpan Kathy Li
Metrology Staff Engineer @Lumentum
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WORK HISTORY
Metrology Staff Engineer @Lumentum
San Jose, CA, US
Photoluminescence, Atomic Force Microscopy, High resolution XRD, Ellipsometry, AOI, CD, etc. Metrology, SPC, Gauge R&R, JMP
EDUCATION
University of Illinois at Urbana-Champaign
Joint PhD candidate, Nanotechnology, Chemical Engineering
Beihang University
Bachelor's degree, Materials Science and Engineering
University of Rochester
Joint PhD candidate, Nanotechnology, Chemical Engineering
Beihang University
Doctor of Philosophy - PhD, Materials Science and Engineering
ABOUT PANPAN KATHY LI
Ph.D. Material Scientist. • Materials characterization (Photoluminescence, AFM, ellipsometry, TIRFM, Confocal, SRS, SEM, TEM, EDX, XRD, Laser Interferometers, ECV profiler, CD, AOI, DSC, RAMAN, FTIR, etc.) • Image Processing (Python, Matlab, Computer Vision). • Managing metrology equipment with total value >7 million. • Leading Kaizen projects, guiding a team through continuous improvement process to identify, analyze, and implement impactful changes. • Metrology data analysis, Visual Basics, JMP, Gauge R&R, SPC. • Bilingual in English and Chinese.
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