Muhammad Younus

Principal Test Development Engineer @TDK InvenSense

Responsible for Test Development of NPI MEMS Products and Software Test Development of Next Generation IMU (Inertial Motion Units) of Vibrating Gyroscope and Accelerometer at Wafer Scale Package “CMOS Plus MEMS” Bounded Wafer, Final Test and Hardware Development using NI PXI Controller and Motion Controller. • Developed and Released TDK-InvenSense First Round Robin 6-Axis IMU IVY product family ICM20628 and the release of five IMU 6-DOF products TUN, VDM, ATH, ISB, HAV and YOK ICM42605M with Final cumulative Yield greater than 95% and Development of Next Generation of Gyro and Accel. • Design and Develop Digital Functional IP’s and Parametric Test IPs, MEMS Gyro and Accel IPs applicable to all companywide products using vertical integration of Test Development, • Designed and Developed and Optimized Multi-site and Modular Advanced OTP Trim Routines. • Apply Advance Test Time Optimization Techniques reducing WS and FT Test Time by 40%. • Devised Innovative Sensing, Optimization and Characterization Techniques, Received TDK Sensing Excellence Award 2014.