Aarushi Mehrotra

About Aarushi Mehrotra

RF Prioduct Development and Characterization Engineer with experience in end-to-end RF characterization, test, and reliability for 2G/LTE/5G front-end modules. At Qualcomm, I’ve led validation across PA modules, tuners, and filters, driving NPI-to-HVM transitions, ATE/bench test development, and KPI alignment with OEMs. Skilled in waveform testing (ACLR, EVM, desense), HVM data analysis (JMP, Exensio), and system-level reliability (HTOL, HAST, TC). Also experienced in RF modeling—integrated AWR VSS with Cadence Virtuoso for radar system redesign. I bridge RF design, validation, and production with a systems mindset.

Experience

1. Senior Rf Product Engineer

   高通

   Nov 2025 — Present

   Own system-level RF performance definition and validation for RF PA modules, Filters, and antenna tuning solutions across 2G, LTE, and 5G NR, supporting multiple NPIs.• Lead cross-functional KPI definition and datasheet signoff with IC design, applications, reliability, and manufacturing teams, covering multiple RF KPIs across cellular standards.• Drive system-level bench validation and performance correlation across multiple concurrent projects, developing waveform-specific test plans to meet customer and carrier requirements.• Serve as technical lead for NPI benchtop characterization, optimizing RF performance across bands and wireless technologies while balancing performance, yield, and reliability tradeoffs.• Lead HVM data analysis and yield improvement efforts, reviewing 10k+ units per lot using Exensio and JMP, delivering 2-5% absolute yield gains through root-cause identification.• Define and oversee module- and system-level reliability qualification (HAST, HTOL, ESD) and deliver statistical reliability reports supporting high-volume production.

Education

• Texas A&M University

  Master of Science - MS, Electrical Engineering

  2019 — 2021

• Shiv Nadar University

  Bachelor of Technology - BTech, Electronics and Communication

  2015 — 2019