Mark Tunik

Sr. Manager, Defect Metrology Technology Team at Hitachi High-Tech AmericaOptical and EBEAM Defect Metrology solutions for development and Yield enhancement.

Role
Manager, Defect Metrology (Optical and Ebeam) Technology Team at Hitachi High-Tech America, Inc.
Location
Portland, OR, US
LinkedIn followers
500 followers

About Mark Tunik

Competencies Semiconductor ManufacturingDefect MetrologyDefect ReductionInline Defect ControlStrong at Problem SolvingData Mining and AnalyzingTechnology Transfer New Part DevelopmentCustomer OrientedOut of the box thinkingApplication on Brigt-field and Dark-field inspection systems (KLA Tencor)Logic and Flash process and control knowledgeIndustrial Engineering and ManagementSafety and Ergonomics SpecialistElectronic Practical Engineer

Experience

  1. Manager, Defect Metrology (Optical and Ebeam) Technology Team

    Hitachi High-Tech America, Inc.

    Oct 2021 — Present · Hillsboro, OR, US

Education

  • Sapir Technology College

    PE, Electronic and Control systems

    2003 — 2006

  • SCE College of Engineering

    Engineer, Industrial Engineering & Management

    2007 — 2011

Skills

  • Semiconductor Equipment
  • Technology Transfer
  • Process Control
  • Eda
  • Product Engineering
  • Process Improvement
  • Etching
  • Vacuum
  • Process Integration
  • Control Charts
  • Root Cause Analysis
  • Design for Manufacturing
  • Analog
  • Cvd
  • Lean Manufacturing
  • Asic
  • Metrology
  • Flash Memory
  • Defect Tracking
  • Test Equipment
  • Photolithography
  • Inspection
  • Pvd
  • Intel
  • Semiconductor Manufacturing
  • Semiconductors
  • Yield Enhancement
  • Fmea
  • Ic
  • R&D
  • Reliability
  • Jmp
  • Characterization
  • Materials Science
  • Failure Analysis
  • Semiconductor Industry
  • Engineering Management
  • Process Simulation
  • Time Studies
  • Optics

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Mark Tunik — Manager, Defect Metrology (Optical and Ebeam) Technology Team at Hitachi High-Tech America, Inc. in Portland, OR, US | Unifers