Krishna Kumar Balasubramanian
Process Engineer @Redlen Technologies Inc.
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WORK HISTORY
Process Engineer @Redlen Technologies Inc.
Victoria, BC, CA
EDUCATION
Vellore Institute of Technology
Bachelor of Technology (B.Tech.), Mechanical Engineering
Arizona State University
Master of Science (MS), Mechanical engineering
SKILLS
ABOUT KRISHNA KUMAR BALASUBRAMANIAN
I am an inspired professional whose vision is to leave the world better than we found it so that together we can have a greater tomorrow. A Manufacturing Process Engineer with 5 years of experience in Microfabrication, NPI, continual improvement, failure analysis, and lean manufacturing. Technical Proficiencies:Process Control: Six Sigma, Statistical Process Control, Process Capability, Failure Mode and Effects Analysis, Design of Experiments, Poka-yokeProgramming and Statistics: MATLAB, Minitab, Python, Microsoft Power BI & Excel, MySQL, C#.Design and Analysis: SolidWorks, Autodesk Inventor, AutoCAD, ANSYS Workbench, MATLAB Simulink.Core Skills:• Hands-on & research experience fabricating MEMS/ Microfluidic chips in class 100 cleanroom environment using Nikon NSR iLine Stepper (365nm), NSR S203 KrF DUV (248nm), and NSR S204 ArF DUV (193nm) Lithography Scanners.• Ability to read complex engineering drawings and good technical product and process knowledge.• Proven experience in developing and driving change and continuous improvement systems as well as influencing and implementing these changes and improvements.• Assessing manufacturing requirements and capabilities prior to the transfer of a new process into manufacturing facilities and providing floor support during the validation, as well as reviewing process data to ensure operational consistency.• Improve cleanroom control procedure by partnering with automated systems (MES) which results in the elimination of processing errors. • A disciplined and structured approach to ensure stability and work with good attention to detail to maintain high-quality standards.Tools: Lithography: Nikon NSR-S203/S204 DUV KrF/ ArF scanner, TEL Clean Track Act 8, Nikon NSR i10 Stepper. Metrology: Optical microscopes, Profilometer, Ellipsometer, Zeiss CMM, AFM, Scanning electron microscopes (SEMs). Assay Development: Hamilton Vantage, and Microlab Star, Quansys, Leica.
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