Karl-Heinz Strass

Managing Director, the Americas @Cybertechnologies

San Jose, CA, US
MOBILE NUMBERS
+14•••••••47

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WORK HISTORY

Jul 2008 — Present

Managing Director, the Americas @Cybertechnologies

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San Jose, CA, US

Independent Maunfacturer\'s Representative for cyberTECHNOLOGIES in the AmericasResponsible for the company\'s business activities in The AmericascyberTECHNOLOGIES is a highly respected and successful manufacturer of non-contact (optical) surface metrology systems and platforms utilized in the semiconductor industry and many related industries, including the medical device, automotive and energy storage industries.Especially their superior solutions to challenges in the advanced semiconductor packaging industry have helped many customers accelerate their backend process development and production capabilities.

EDUCATION

1983 — 1987

University of Applied Sciences, Munich

MS, Univ of Applied Sciences Munich, Precision Engineering/Mechatronic

SKILLS

Product DevelopmentSemiconductorsMetrologySensorsTechnical MarketingP&L ManagementManagementMarket AnalysisSalesManufacturingStrategic ThinkingCompetitive AnalysisStart-UpsDirect SalesInternational SalesSolution SellingLithographyBusiness DevelopmentProduct MarketingGo-to-Market StrategySales OperationsPricing StrategySemiconductor IndustryProduct LaunchProduct ManagementGlobal Business DevelopmentThin FilmsKey Account ManagementKey Account DevelopmentMedical DevicesInternational BusinessCross-Functional Team LeadershipSales ManagementPricingStrategyPhotovoltaicsStrategic PartnershipsEngineering ManagementOpticsCrm

ABOUT KARL-HEINZ STRASS

Stramatec LLC connects precision-driven industries with the most advanced 3D optical surface measurement and inspection solutions — from sub-nanometer roughness to high-throughput production metrology.Suppliers we represent: cyberTECHNOLOGIES GmbH: High-speed, production-proven 3D profilometry for semiconductor, medical, and electronics manufacturing. Standout highly innovative and powerful 3D surface metrology systems for nanotechnologies.🟠 GBS Metrology: Compact, high-resolution innovative White Light Interferometers smartWLI, ideal for quick nm-resolution measurements of sub-micron topographies, nm surface roughness, bonding surface characterization and CMP validation🟣 KoCoS Optical Metrology: Highly competitive and modular optical systems, ideal for cost-effective quality control of wafer edge and diameter, bevel shape and ingot defect inspection.

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