Jinhee Kim
Applications Scientist @Bruker Nano Surfaces & Metrology
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WORK HISTORY
Applications Scientist @Bruker Nano Surfaces & Metrology
Santa Barbara, CA, US
Photothermal Atomic Force Microscopy - Infrared Spectroscopy is a characterization tool that provides nanoscale structure, chemical composition and mechanical properties of materials. As an expert of the tool, I inform and demonstrate the technical details and operation of the tool in line with the customers\' needs.
EDUCATION
Adrian C. Wilcox High School
High school diploma
Earlham College
Bachelor of Arts (B.A.), Chemistry
University of Michigan - Rackham Graduate School
Doctor of Philosophy (Ph.D.), Materials Chemistry
ABOUT JINHEE KIM
I am a materials chemist Ph.D. specialized in AFM-IR (atomic force microscopy - infrared spectroscopy) which harness the benefits of the nanoscale spatial resolution of an AFM and chemical bonding/composition information of FTIR spectroscopy. This hybrid technique addresses the longstanding shortcomings of FTIR and AFM individually, and therefore is equipping many academic and industrial scientists with information they need to find their solutions to innovate and develop their products and research to the next level.
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