Jayshree Bhajipale

Senior Device Engineer @Micron Technology

Mumbai, IN
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+91 *********19

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WORK HISTORY

Oct 2023 — Present

Senior Device Engineer @Micron Technology

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Hyderabad, IN

EDUCATION

2000 — 2010

St. Xavier's High School, Nagpur

High School

2014 — 2016

Indian Institute of Technology Gandhinagar (IITGN)

Master of Technology (M.Tech), Microelectronics

2012 — 2016

Shri Guru Gobind Singhji Institute of Engineering and Technology, Vishnupuri, Nanded

Bachelor of Technology (B. Tech), Electronics and Telecommunication Engineering

2016 — 2023

Indian Institute of Technology, Bombay (IITB)

Doctor of Philosophy (PhD), Microelectronics

ABOUT JAYSHREE BHAJIPALE

I completed my Ph.D. from the Department of Electrical Engineering department, Indian Institute of Technology Bombay (IITB), India. I have worked rigorously on Sentaurus TCAD (sprocess, sde, and sdevice), characterization, and fabrication of semiconductor devices. I worked on MOS devices and silicon solar cells from the perspective of semiconductor device physics, fabrication, electrical and optoelectrical characterization, and TCAD simulations. My research mainly focuses on Si surface passivation with dielectric thin films. I was also involved in the characterization and analysis of MOSFET devices fabricated using photolithography. For my M. Tech dissertation, I worked on enhancing the gain of vertical bipolar junction transistors using process-flow compatible with SCL’s 180nm CMOS technology (collaboration with SCL, Govt. of India) using TCAD sprocess, structure, and sdevice simulation. Skills-TCAD process, structure, and device simulation of CMOS devices, and Si solar cells- Fabrication: Plasma Enhanced Chemical Vapor Deposition (PECVD), Radio Corporation of America (RCA) Cleaning, Piranha Cleaning, E-beam and thermal evaporator, Spray coating for dielectric film deposition, UV-Ozone Cleaning, Furnace annealing, Optical lithography-Characterization: I-V and C-V measurement, Spectroscopic Ellipsometry, Transmission Electron Microscopy (TEM), Scanning electron Microscopy (SEM), Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS), Fourier Transform Infrared Spectroscopy (FTIR), UV-Vis-NIR spectroscopy, Photoluminescence/Electroluminescence Imaging, Quantum efficiency measurement, Light Beam Induced Current mapping, Lifetime Characterization.

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Jayshree Bhajipale — Senior Device Engineer at Micron Technology in Mumbai, IN | Unifers