Jayshree Bhajipale
Senior Device Engineer @Micron Technology
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WORK HISTORY
Senior Device Engineer @Micron Technology
Hyderabad, IN
EDUCATION
St. Xavier's High School, Nagpur
High School
Indian Institute of Technology Gandhinagar (IITGN)
Master of Technology (M.Tech), Microelectronics
Shri Guru Gobind Singhji Institute of Engineering and Technology, Vishnupuri, Nanded
Bachelor of Technology (B. Tech), Electronics and Telecommunication Engineering
Indian Institute of Technology, Bombay (IITB)
Doctor of Philosophy (PhD), Microelectronics
ABOUT JAYSHREE BHAJIPALE
I completed my Ph.D. from the Department of Electrical Engineering department, Indian Institute of Technology Bombay (IITB), India. I have worked rigorously on Sentaurus TCAD (sprocess, sde, and sdevice), characterization, and fabrication of semiconductor devices. I worked on MOS devices and silicon solar cells from the perspective of semiconductor device physics, fabrication, electrical and optoelectrical characterization, and TCAD simulations. My research mainly focuses on Si surface passivation with dielectric thin films. I was also involved in the characterization and analysis of MOSFET devices fabricated using photolithography. For my M. Tech dissertation, I worked on enhancing the gain of vertical bipolar junction transistors using process-flow compatible with SCL’s 180nm CMOS technology (collaboration with SCL, Govt. of India) using TCAD sprocess, structure, and sdevice simulation. Skills-TCAD process, structure, and device simulation of CMOS devices, and Si solar cells- Fabrication: Plasma Enhanced Chemical Vapor Deposition (PECVD), Radio Corporation of America (RCA) Cleaning, Piranha Cleaning, E-beam and thermal evaporator, Spray coating for dielectric film deposition, UV-Ozone Cleaning, Furnace annealing, Optical lithography-Characterization: I-V and C-V measurement, Spectroscopic Ellipsometry, Transmission Electron Microscopy (TEM), Scanning electron Microscopy (SEM), Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS), Fourier Transform Infrared Spectroscopy (FTIR), UV-Vis-NIR spectroscopy, Photoluminescence/Electroluminescence Imaging, Quantum efficiency measurement, Light Beam Induced Current mapping, Lifetime Characterization.
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