Hsien-Lien Huang
Engineer | Semiconductor Failure Analysis | TEM/FIB & Automation
- Role
- Tem Engineer at Samsung Semiconductor
- Location
- Austin, TX, US
- LinkedIn followers
- 500 followers
About Hsien-Lien Huang
TEM Engineer with experience in electron microscopy, semiconductor failure analysis, and workflow automation. Focused on developing FIB/TEM-based analysis workflows and applying machine learning techniques to improve efficiency and consistency in microscopy data processing.Interested in bridging physical analysis with data-driven methods to support better understanding of semiconductor structures and defects.
Experience
Tem Engineer
Aug 2023 — Present · Austin, TX, US
Developed automation workflows for TEM/FIB-based failure analysis• Built tools for TEM request generation, including sample parsing and grouping• Applied machine learning techniques for microscopy image analysis• Processed TEM/FIB imaging data for analysis and interpretation
Education
National Chung Hsing University
Bachelor of Science (B.Sc.), Chemical Engineering
2008 — 2012
Cornell University
Master of Engineering (M.Eng.), Chemical Engineering
2015 — 2016
The Ohio State University
Doctor of Philosophy - PhD, Materials Science and Engineering
2018 — 2023
Cornell University
Master of Science (MSc), Chemical Engineering
2016 — 2018
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