Erwin Hendarto
Manager, Failure Analysis Lab | Silicon Labs
- Role
- Manager, Failure Analysis Lab at Silicon Labs
- Location
- Austin, TX, US
- LinkedIn followers
- 500 followers
About Erwin Hendarto
Results-driven semiconductor professional with over 15 years of hands-on experience in failure analysis (FA), supporting product development, quality improvement, and root cause investigations. Demonstrates a strong foundational understanding of reliability testing methodologies and their integration with FA processes. Actively engaged in the global FA community through regular participation and contributions to leading industry conferences such as ISTFA (US) and IPFA (Asia).Recognized for strategic cross-functional collaboration and driving the evolution of failure analysis best practices.
Experience
Manager, Failure Analysis Lab
Apr 2024 — Present · Austin, TX, US
Established a Device Analysis Lab in Asia from the ground up by collaborating with local facilities, safety, and environmental teams; negotiated with multiple tool vendors; and successfully recruited and onboarded key personnel.• Led cross-regional engineering teams in the US and Asia, delivering comprehensive company-wide support for failure analysis (FA), electrostatic discharge (ESD), and latch-up (LU) investigations.• Active contributor to the semiconductor reliability and failure analysis community: • Committee Member, Reviewer, and Session Chair/Co-chair for ISTFA (International Symposium for Testing and Failure Analysis) since 2015 • Reviewer and Session Chair for IPFA (International Physical and Failure Analysis of Integrated Circuits) since 2020
Education
Raffles Junior College
GCE A Level
National University of Singapore
Bachelor of Engineering
University of Michigan
Doctor of Philosophy (Ph.D.)
University of Michigan
Master of Science (MS)
Skills
- Comsol
- Scanning Electron Microscopy
- Edx
- Esd-Cdm
- Characterization
- Csam
- Physics
- Mems
- X-Ray Analysis
- Materials Science
- Failure Analysis
- Laser Vibrometer
- Nanotechnology
- Nanoprobing
- Focused Ion Beam
- Esd-Tlp
- Microfluidics
- Afm
- Simulations
- Optics
- Fluent
- Micro-Electro-Discharge Machining
- Solidworks
- Ansys
- Integrated Circuits (Ic)
- Labview
- Matlab
- Circuit Edit
- Scanning Thermal Microscopy
- Semiconductors
- Thin Films
- Atomic Force Probing
- Wirebonding
- Esd-Mm
- Optical Beam Induced Resistance Change
- Ni Labview
- Sensors
- Photon Emission Microscopy
- Liquid Crystal Analysis
- Esd-Hbm
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