Duc Nguyen
Defect Metrology and Yield Engineer at Intel Corporation
- Role
- Defect Metrology and Yield Engineer at Intel
- Location
- Hillsboro, OR, US
- LinkedIn followers
- 500 followers
ScienceView LinkedIn profile
Experience
Defect Metrology and Yield Engineer
Sep 2019 — Present · Portland, OR, US
Skills
- Physics
- Thermal Evaporation
- Nanolithography and Manipulation
- Nanomaterials
- Electron Beam Evaporation
- Scanning Tunneling Microscopy
- Nanotechnology
- Chemistry
- Surface Chemistry
- Silicon
- Powder X-Ray Diffraction
- Ultrahigh Vacuum
- Surface Science
- Uv-Vis-Nir
- Laser
- X-Ray Diffraction
- Glass Dynamics
- Quantum Dots
- Single-Molecule Absorption
- Afm
- Spectroscopy
- Uv/Vis Spectroscopy
- Clean Rooms
- Research
- Silicon Carbide
- Matlab
- Epitaxial Graphene
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