Derek Robertson

About Derek Robertson

Highly experienced in the field of test techniques and test strategy for electronic card assemblies with a broad background in design for testability (DFT) requirements, structural test methods, and functional test processes. I lead the IBM Integrated Supply Chain (ISC) card test strategy team which defines the test methods to be used for all IBM server, mainframe and storage brands. I have applied technical and leadership skills to implement manufacturing process changes and to help solve complex issues ranging from test access reduction to determining root cause of test induced fails and electrical overstress. I regularly provide support and guidance to the IBM ISC and Product Development communities, as well as to external card manufacturing subcontractors I have driven changes in card test strategy and product sourcing to enable increased flexibility in delivery of test solutions (internal vs outsourced test development). My expertise in design for testability and technical leadership have enabled a range of test methods which have maintained test coverage in environments where product technology has rendered traditional methods ineffective. These advancements have ensured that operational capability can be maintained and delivery of quality products to clients can continue. I am experienced in Supplier management, providing test requirements and ensuring that expectations for Supplier deliverables are clearly understood. I provide technical support for test issues discovered during new product introduction and during volume production. In addition to my extensive technical background, I have experience in performing strategic assessments of critical issues with a focus on business impacts - ensuring that solutions are developed in a cost effective and timely manner.

Experience

1. Director, Test Engineering

   Lenovo

   Oct 2014 — Present · Morrisville, NC

   Responsible for managing a worldwide team of Test Engineers and Programmers responsible for developing and maintaining the manufacturing test platform for Lenovo\'s Data Center Group products and for developing test solutions for Hyperscale, Hyperconverged and HPC products.

Education

• Robert Gordon University

  BEng Hons, Electronic and Information Engineering

  1985 — 1989

Skills

• Hardware Architecture
• Storage
• Processors
• Semiconductors
• Test Automation
• Product Development
• Debugging
• Manufacturing
• Simulations
• Asic
• Automation
• Systems Engineering
• Electronics
• Hardware
• Testing
• Electrical Engineering
• Microcontrollers
• Embedded Systems
• Test Planning
• Servers
• Pcb Design