Clifford Bueno
Technical Fellow at BLUE ORIGINNAS410 Level 3 Computed Tomography
- Role
- Technical Fellow at Blue Origin
- Location
- Bradenton, FL, US
- LinkedIn followers
- 500 followers
About Clifford Bueno
Extensive Experience in Digital X-ray Methods including computed tomography and digital radiography for Nondestructive Testing.Recent Recognition • 2014 Extraordinary Performance Award for High Energy X-ray Program (Team Award) • 2013 Dushman Award from GE Global Research for technical achievement (Team award)• 2010 Charles W. Briggs award from ASTM International• 2010 Senior Technical Excellence Award, GE Global Research• 2003 R&D 100 Award, GE Global Research with GE Inspection Technologies• 2003 R&D 100 Most Socially Responsible New Technology awarded at Banquet• 2003 ASNT Mohawk-Hudson Section Technical Achievement Award• 1995 R&D 100 Award, Lockheed Martin ATC with Image Quality, IncPatents and Publications• Co-inventor on 28 US patents and numerous International patents on X-ray technologies• Author of 2 radiography review chapters in books on nondestructive testing• Coauthor of several ASTM standards on non-film methods• Contributor to proceedings articles, and refereed articlesOther Activities• Associate Editor of the Research in Nondestructive Evaluation journal. • Chair of the ASTM Nondestructive Testing section on non-film X-ray methods• Lecturer to the GE Global Research Edison Engineering Development Program• Served as President and Board Member of the Clifton Park-Halfmoon Public Library• Founding member of the Future Scientists and Engineers Club with Zoller Elementary
Experience
Technical Fellow
Feb 2024 — Present · Kent, WA, US
Education
University at Buffalo
Doctor of Philosophy (Ph.D.), Chemistry
1978 — 1982
Skills
- Image Analysis
- Medical Imaging
- Analytical Chemistry
- Nanomaterials
- Engineering
- Aerospace
- R&D
- Chemical Engineering
- Coatings
- Numerical Analysis
- Electronics
- Sensors
- Physics
- Nanoparticles
- Digital Radiography
- Polymers
- Signal Processing
- Semiconductors
- Characterization
- Spectroscopy
- Thin Films
- Materials Science
- Failure Analysis
- Standards Development
- Electrochemistry
- Chemistry
- Nanotechnology
- Optics
- Powder X-Ray Diffraction
- Image Processing
- Scanning Electron Microscopy
- Surface Chemistry
- Experimentation
- Design of Experiments
- Corrosion
- Biomedical Engineering
- Fortran
- Patents
- Simulations
- Mathematical Modeling
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