Chung-Yu Shih
PTD Yield Engineer, Intel
- Role
- Yield Engineer at Intel
- Location
- Portland, OR, US
- LinkedIn followers
- 500 followers
About Chung-Yu Shih
Engineering physicist with experiences in process development from path finding to high…
Experience
Yield Engineer
Jul 2013 — Present · Hillsboro, OR, US
Owner of scanning electron microscopes, optical inspection equipment and atomic force microscope. Develop semiconductor manufacturing process, document specs, manage fleet performance and successfully transferred IPs to the virtual factories for high volume manufacturing. Characterized multiple types of optical inspection equipment with nonlinear frequency converted lasers and complex PMT detector modules. Developed methodology and statistical process control chart to manage fleet matching. Developed metrology systems with CD measurement capability, enabling patterning process monitoring with sub-nm precision, translating to yield improvement for all technology nodes. Resolved a major defect issue. Designed experiments and identified the root cause, planned and executed replacement 25% faster than the original schedule proposed by the vendor, managed daily operation for the entire eet to minimize impact to the development and production. Saved tens of millions of dollars as a result. Developed an automated in-line monitoring system that identifies the contaminated process tools that require cleaning. Trained and managed four technicians to support engineering activities and NPI recipe work for 24/7 coverage, improving request turnaround time by 50%.
Education
Georgia Institute of Technology
Ph.D
2006 — 2013
National Tsing Hua University
Bachelor of Science (BS)
2001 — 2005
Skills
- Fiber Optics
- Characterization
- Spectroscopy
- Zemax
- Metrology
- Quantum Mechanics
- Optical Engineering
- Research and Development (R&D)
- Simulations
- Physics
- Laser Physics
- Matlab
- Python
- Latex
- Experimentation
- Design of Experiments
- Quantum Optics
- Laser
- Systems Engineering
- Mathematica
- Atomic Physics
- Semiconductor Process
- Data Analysis
- Scanning Electron Microscopy
- Jmp
- Statistics
- Optics
- Image Processing
- Piezoelectric
- Interferometry
- Labview
- Optical Tweezers
- Statistical Process Control (Spc)
- Semiconductors
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