Chuanhsi Hung

Semiconductor Metrology Professional | Thin Film & Scatterometry | Data-Driven Problem Solver | Mentor & Trainer | Cross-Functional Excursion Support | Ellipsometer Comprehension

Role
Staff Metrology Engineer, Aptd at Micron Technology
Location
Lehi, UT, US
LinkedIn followers
500 followers

About Chuanhsi Hung

I’m a Senior Metrology Engineer with a Ph.D. and a passion for solving complex problems in the semiconductor industry. Over the years, I’ve built a strong foundation in metrology, characterization, and advanced material analysis—using techniques like ellipsometry and optical systems to ensure products meet and exceed quality expectations.What sets me apart is my ability to think critically and creatively, often developing resourceful, cost-effective solutions that not only solve the immediate issue but prevent it from recurring. I’ve even co-developed a patented product that remains in service today—an achievement I’m particularly proud of, as it moved from concept to market through deep research, hands-on engineering, and effective teamwork.I thrive in high-pressure environments and enjoy working with cross-functional teams to drive company goals forward. I believe strong collaboration—within teams and across departments—is key to successful outcomes. I’m also a lifelong learner, constantly refreshing my technical skills to stay aligned with the fast-moving pace of the semiconductor field.Whether I’m leading a team, supporting a project, or jumping in to troubleshoot a critical issue, my focus is always on delivering reliable results that benefit both the company and the customer.

Experience

  1. Staff Metrology Engineer, Aptd

    Micron Technology

    Jan 2025 — Present · Boise, ID, US

Education

  • Brigham Young University

    Doctor of Philosophy (Ph.D.), Analytical Chemistry

    2009 — 2015

  • Brigham Young University–Hawaii

    Bachelor's degree, Biochemistry

    2005 — 2008

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Chuanhsi Hung — Staff Metrology Engineer, Aptd at Micron Technology in Lehi, UT, US | Unifers