Amit Srivastava
Staff Program Manager | Data Science & AI @ Micron | Delivering Business Value at Scale | $50M+ Impact
- Role
- Staff Program Manager - Smart Manufacturing & Ai at 美光科技
- Location
- Manassas, VA, US
- LinkedIn followers
- 500 followers
About Amit Srivastava
I’m a data-driven program leader with 18+ years of experience delivering high-impact AI, data science, and smart manufacturing initiatives across the semiconductor industry. At Micron, I currently lead $50M+ programs integrating machine learning into fab operations — improving productivity by 25%, reducing downtime by 20%, and enabling the successful transfer of 600+ smart manufacturing applications from Asia to the U.S.With a strong foundation in engineering and a passion for scalable innovation, I bridge the gap between technical teams, global operations, and executive stakeholders. I’ve built and mentored high-performing cross-functional teams, led strategic automation efforts, and acted as a key liaison across IT, finance, quality, and manufacturing functions.Key Strengths- AI/ML Integration into Manufacturing- Data-Driven Program Execution- Cross-Functional Team Leadership-$MM Budget Management- Strategic Roadmapping & Execution- Industry 4.0 | Semiconductor Ops | SustainabilityRecognized as a thought leader and SEMICON panelist, I’m driven to solve complex problems and make data science actionable at scale—delivering measurable results in highly dynamic, global environments.
Experience
Staff Program Manager - Smart Manufacturing & Ai
Oct 2025 — Present · Manassas, VA, US
Generative AI, AI Agents, Machine Learning, Data Science & Analytics, Big Data, Edge Computing for AI
Education
Indian Institute of Technology, Bombay
M.Tech, Computer Integrated Manufacturing
2002 — 2007
Indian Institute of Technology, Bombay
B.Tech, Mechanical Engineering
2002 — 2007
Skills
- Semiconductors
- Product Management
- Characterization
- Klarity
- Engineering
- Process Engineering
- Product Development
- Failure Analysis
- Semiconductor Process
- Bright Field Inspection
- Yms
- Dark Field Inspection
- E-Beam Inspection
- Siview
- Yield Management
- Feol
- Mol
- Beol
- Lavis
- Nanopoint
- Semiconductor Industry
- Metrology
- Design for Manufacturing
- Design of Experiments
- Spc
- Manufacturing
- Yield
- Process Integration
- Silicon
- Jmp
- Cvd
- Statistical Process Control (Spc)
- Electronics
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